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Table of Contents

Definition

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Often, a Defect issue type is also used as a Requirement. To assert that a Defect does not occur again, it can be also considered for testing. Xray allows the same issue type to be mapped as a Requirement and a Defect. So, a Defect can also be associated with Test issues and be considered for Requirement Coverage charts and Custom Fields. 

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Sub-Requirements

A requirement can be associated with sub-requirements, resulting in a hierarchy of requirement issues. "Epic" requirements can thus be decomposed into smaller requirements, each associated with specific tests. This decomposition of requirements facilitates the management of epic requirements and makes their coverage analysis easier.

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Info

For more information on Requirement Status and coverage, please go to the Requirements Coverage Analysis page.

 


Associating a Requirement

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- Input the desired Requirement Issue Key on the Issue field;
- Click on the Down Arrow on the Issue field and select the Requirement from its History Search list;
- Click on the search for an issue link to use the Find Jira issues browser;

Step 5: Click Link.

 


From the Test Set issue view screen

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